February 7, 2007 lecture by Fabian Klass for the Stanford University Computer Systems Colloquium (EE 380). The focus of this talk is on IC manufacturing process variability, i.e., how to design circuits for yield in the presence of manufacturing variations; also, the use of statistical methods in circuit design is presented.
EE 380 | Computer Systems Colloquium:
Stanford Computer Systems Laboratory:
Stanford Center for Professional Development:
Stanford University Channel on YouTube:
Tagged under: Computer,science,software,engineering,programming,design,application,Fabian,Klass,IC,manufacturing,yield,fab,circuits
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